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. 2018 Sep;51:774–785. doi: 10.1016/j.nanoen.2018.07.020

Fig. 1.

Fig. 1

X-ray diffraction patterns from as produced powder samples (a) S2 (230 °C) and S3 (260 °C) samples of CuO (left) along with larger angle shift in (111) peak position (right) at higher temperature, (b) S4 (150 °C), S5 (200 °C), S6 (230 °C) and S7 (260 °C) samples of Cu2±xSe nano/micro-powders (left) along with smaller 2θ shift in (541) peak with increase in reaction temperature (right), and (c) S6 (0%), S8 (1%) and S9 (2%) Ag doped Cu2±xSe (left) and enlarged view of diffraction peaks in the 2θ range of 43–45°.