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. 2018 Jul 11;7:31. doi: 10.1038/s41377-018-0031-z

Table 1.

Standard deviation of position errors from widefield measurements

Array x direction (nm) y direction (nm)
Standard process 1.95 ± 0.03 1.97 ± 0.03
Low current, long dwell 2.43 ± 0.04 2.00 ± 0.03
Low current, many passes 2.11 ± 0.04 1.35 ± 0.02

Uncertainties are one standard error of the standard deviation50