Fig. 4.

Fraunhofer evolution for devices with thicker flakes. a–c Fraunhofer evolution for devices 2–4, which have different flake thicknesses. For comparison, the data were rotated so that the lobe minima are vertical for better comparison and approximate minima are marked with black dots. The side branch slope is illustrated for device 2 in a. d The relation between the slope of the side branch m (normalized by effective electrode distance d) and thickness t of the TI flake. Experimental data (with error bars for deviations in extracted slopes) are compared with simulations for each device using a finite momentum pair model. The theory and data matches best for a model that takes into account both ZME and FME. v_f = 5 × 10⁵ m s⁻¹, g = 19 are used in the simulations^31,32