Skip to main content
. 2018 Aug 10;8(8):609. doi: 10.3390/nano8080609

Figure 3.

Figure 3

Atomic force microscopy measurements Mold100, Mold50, PFPE intermediate molds and COC final replicas. (a) FWHM of Mold100 ridges (M-R) and grooves (M-G), and respective COC replica ridges (C-R) and grooves (C-G). (b) FWHM of Mold50 ridges (M-R) and grooves (M-G) and respective COC replica ridges (C-R) and grooves (C-G). Data in (a,b) are mean ± SD, */** p < 0.05/0.01, unpaired t-test. (c) Representative 3D AFM images for ridges and grooves of the Mold100, PFPE intermediate mold, and COC final replica.