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. 2018 Jul 28;11(8):1306. doi: 10.3390/ma11081306

Figure 5.

Figure 5

Typical top-down low-magnification scanning electron microscopy (SEM) micrographs of adherent cells on comb structures with various trench widths. Trench axes are in the vertical direction. Cells on blanket tantalum and silicon oxide films are also included. These micrographs show cells align with the trench axes on the comb structures. Cells preferentially adhered to tantalum surfaces on the 10, 50, and 100 μm comb structures. Scale bars correspond to 50 μm.