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. 2018 Jun 20;293(35):13440–13451. doi: 10.1074/jbc.RA118.002853

Figure 5.

Figure 5.

N-terminal residues affect rectification of LRRC8 channels. A, I/V curves obtained from ramp protocols from T5C/WT LRRC8A/C channels in the absence or presence of MTSEA or MTSES. B, I/V relationship of WT/WT, T5R/T5R, and R8C/R8C LRRC8A/C channels. C, mean ICl,vol densities of the indicated channels at +120 mV. D, average rectification defined as the ratio between the maximum current at +120 and −120 mV. E, average rectification for WT/WT and T5C/WT LRRC8A/C in the presence or absence of MTSES (the control values for WT the same as in D). Error bars, S.D.; *, p < 0.05; **, p < 0.01 (Kruskal–Wallis test, Dunn's post hoc test versus WT; false-discovery rate controlled by Benjamini–Hochberg procedure). pF, picofarad.