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. 2018 Sep 3;9:3572. doi: 10.1038/s41467-018-05580-z

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 3 — Microstructure and composition distribution of Pd/b2-TiO₂/b-Si. a Cross-sectional TEM image and related high-magnification images of Pd/b2-TiO₂/b-Si. The scale bar label is 200 nm in TEM image. The inset in TEM image is the magnification image of the specified area by HRTEM with the scale bar label of 5 nm. High-magnification images on the right correspond to the marked area in the inset with the scale bar label of 2 nm. b HADDF-STEM image with matching elemental distribution map for Pd/b2-TiO₂/b-Si. Ti, O, Pd, and Si are represented as yellow, purple, red, and Cambridge blue, respectively. All the scale bar labels are 200 nm