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. 2018 Sep 3;9:3563. doi: 10.1038/s41467-018-06071-x

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — Focused ion beam (FIB) crafted diamond anvil. a Cross-section of a FIB modified diamond anvil showing the tuning parameters: culet (c), torus radius (r_T), depth of torus (d), and depth of outer shoulder (d₂); the red dotted line is the outline of the starting diamond anvil shape. b 3D model of a toroidal anvil. c Scanning electron microscope image of the modified diamond anvil; scale bar length is 30 µm. Please note the vertical axes in a, b