Table 2.

TTX resistance and channel function as measured on cut‐open voltage clamp recording

		TTX resistance		Activation		Fast‐inactivation
NaV1.4 mutant	n	K d ± CI (nM)	n	V 1/2 ± CI (mV)	n	V 1/2 ± CI (mV)
NaV1.4+	13	50 ± 5.2	7	–36.2 ± 1.0	9	−56.6 ± 0.7
NaV1.4V	11	65 ± 11	8	–34.7 ± 1.9	8	−49.2 ± 0.8
NaV1.4LVNV	11	13000 ± 1800	7	–16.4 ± 0.5	10	−54.7 ± 0.7

For each channel type, TTX resistance was measured as the TTX concentration that blocked 50% of channels (K _d ± 95% CI). The voltage values (mV) are shown for which 50% of channels are open due to activation and closed due to fast‐inactivation (V _1/2 ± 95% CI).