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. 2018 Jun 18;1:72. doi: 10.1038/s42003-018-0074-y

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 3 — XPS of the implant surfaces. Survey spectra of a the TiMA and b TiNT surfaces. The two spectra appeared very similar in elemental composition indicating no notable surface contamination due to the multiple processing steps required for the TiNT surface. c, d Deconvolution of the Ti envelop for c TiMA surface and d TiNT surface. TiMA surface had a thin (<10 nm) TiO₂ layer as the underlying metal peak is seen at 453.2 eV (arrow). On the contrary, this and the sub-oxide peaks at <456 eV were absent in the TiNT surface, on which the oxide layer was >10 nm (the sampling depth of the technique)