Figure 5.
The film growth behavior of (A) LbL film 1 and (B) LbL film 2 determined by AFM sectional height analysis in air. The data were fitted with least squares linear regression with coefficient of determination R2 for film 1 being 0.9924 and film 2 being 0.9865. AFM height images of (C) LbL film 1 and (D) LbL film 2 with the right part of the film removed to allow film thickness measurements by AFM. These images were captured by AFM contact mode in PBS buffer. Z range =400 nm. Scale bar =5 μm.
Abbreviations: LbL, layer-by-layer; AFM, atomic force microscopy.