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. 2018 Sep 4;13:5045–5057. doi: 10.2147/IJN.S166661

Figure 2.

Figure 2

SEM images showing the surface topography of samples (scale bar of AC, E =2 µm, scale bar of D, F =400 nm).

Notes: (A) SLM sample with unmelted titanium particles and spheres on the rough waving surface; (B) MP sample with flat surface; (C, D) different magnifications of AO sample showing the arranged TiO2 nanotubes; (E, F) different magnifications of AOC sample showing the amorphous nanoparticles embedded in the nanotubes or the interval of nanotubes.

Abbreviations: SEM, scanning electron microscopy; SLM, selective laser melting; MP, mechanically polished; AO, anodic oxidation; AOC, anodic oxidation composited with electrochemical deposition.