Figure 2.

Cross section of FEM-simulated indentation of an axisymmetric layer model. The spherical AFM probe moves to a depth, D, in contact with the sample and reports the reaction force, F, at the center of the indenter. (A) The corresponding von Mises stress field shows high stress at the interface of top and bottom layers. (B) The corresponding indentation field, approximated by the range of nonzero axial displacement at a prescribed indentation depth, illustrates the inclusion and substrate volumes (V_inc and V_sub, respectively) within the indentation field demarcated by the outermost displacement contour. To see this figure in color, go online.