Table 6. Magnitudes of metrology changes.

Changes after each cycle of indexing and refinement using the expanding method are shown. Cycle 1: result after refining initial indexing solutions. Cycles 2–4: results after reindexing using the metrology of the previous cycle and re-refining using the expanding method. Shift: mean ± standard deviation of the magnitude of shifts in the xy plane (orthogonal to the beam vector). As an example, during cycle 1 the four quadrants moved 138 ± 111 µm on average. z Offsets: shifts along the z axis (equivalent to the detector distance). As the detector is constrained to be coplanar, all groups move the same amount. τ₁: mean ± standard deviation of the rotation around the z axis. All values are relative to the parent frame.

	Level	Shift (µm)	z Offsets (µm)	τ1 (°)
Cycle 1	Detector	56.3 ± 0.0	99.3	0.0 ± 0.0
	Quadrants	138.3 ± 110.7	−118.1	0.2 ± 0.2
	Sensors	53.7 ± 53.5	37.2	0.2 ± 0.1
Cycle 2	Detector	0.4 ± 0.0	−42.8	0.0 ± 0.0
	Quadrants	3.8 ± 1.5	−18.0	0.0 ± 0.0
	Sensors	9.8 ± 6.3	71.0	0.0 ± 0.0
Cycle 3	Detector	0.1 ± 0.0	−84.0	0.0 ± 0.0
	Quadrants	1.6 ± 0.5	3.6	0.0 ± 0.0
	Sensors	11.1 ± 6.1	86.0	0.0 ± 0.0
Cycle 4	Detector	0.2 ± 0.0	−92.2	0.0 ± 0.0
	Quadrants	1.5 ± 0.7	3.3	0.0 ± 0.0
	Sensors	9.0 ± 6.3	90.9	0.0 ± 0.0