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. 2018 Sep 10;13:171. doi: 10.1186/s13014-018-1122-y

Fig. 2.

Fig. 2

Kaplan–Meier analysis of OS according to (a) failure pattern (LN vs. PF, P = 0.004) before matching; (b) re-irradiation (re-RT vs. without re-RT, P < 0.001) before matching; (c) failure pattern (LN vs. PF, P = 0.004) after matching; and (d) re-irradiation (re-RT group vs. non-re-RT group, P < 0.001) after matching