Fig. 2. (a) High angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) image and (b) the overall STEM/EDX elemental map of a fragment of a 20 μm thick TiO2 nanotube layer coated with 10 nm of CdS. The green arrow indicates the EDX line scan across the nanotube fragment. (c) The EDX compositional profile corresponding to the line scan.
