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. 2018 Aug 14;10(35):16601–16612. doi: 10.1039/c8nr02418a

Fig. 3. (a) XPS survey spectra of a 20 nm thick CdS film on a Si (100) wafer before and after sputtering. High resolution XPS spectra of (b) Cd and (c) S. (d) Cd MNN Auger spectra.

Fig. 3