Table 1. Summary of the σ_⊥ measurement.

Deposition temperature (°C)	Average thickness (nm)	Crystallization orientation	Average σ⊥ (S/cm)	SD of σ⊥ (S/cm)	Relative vertical resistance through same area*	Anisotropy (σ///σ⊥)
190	387.4	Edge-on	0.00645	0.00304	1	7.33 × 104
190	25.7	Face-on	0.000372	0.000131	1.15	2.88 × 106
300	28.3	Face-on	0.00135	0.000688	0.350	2.05 × 106

*R_⊥/R_⊥ (190°C-grown edge-on PEDOT) given the same contact area S.