Table 1.
Summary of the growth conditions and surface morphology of the Fe3O4 films obtained by AFM.
| Sample | Structure | Post Anneal. | RMS (nm) | Peak -to- Valley height (nm) | Grain diameter (nm) | Method |
|---|---|---|---|---|---|---|
| A | Fe3O4[4]/MgO(100) | X | 0.42 ± 0.01 | 3.5 ± 0.1 | 32.0 ± 1.0 | Oxide-MBE |
| A1 | Fe3O4[4]/MgO(100) | 300 °C, 3 hours | 0.70 ± 0.03 | 6.4 ± 0.1 | 39.0 ± 2.0 | Oxide-MBE |
| B | Fe3O4[6]/MgO(100) | X | 0.52 ± 0.02 | 5.7 ± 0.7 | 37.0 ± 1.0 | Oxide-MBE |
| B1 | Fe3O4[6]/MgO(100) | 300 °C, 3 hours | 0.73 ± 0.02 | 6.8 ± 0.2 | 40.0 ± 1.0 | Oxide-MBE |
| C | Fe3O4[40]/MgO[5]/Ta[5]/SiO2/Si(100) | 400 °C, 2 hours | 1.10 ± 0.01 | 12.0 ± 1.3 | 42.0 ± 3.0 | RF-magnetron sputtering |
The numbers in brackets represent the thickness of the respective layers in nm.