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. 2018 Sep 18;9:3806. doi: 10.1038/s41467-018-06204-2

Fig. 6.

Fig. 6

Ions migration in perovskite films. Activation energy represents how easily ions migrate. a Device structure used in activation energy measurement. b The temperature-dependent conductivity of perovskite films. Ions conductivity represents how fast ions migrate. c Device structure used in galvanostatic characterization. d Polarization curve in Au/perovskite/Au device measured in air by applying a constant current of 2 nA. The voltage response with time is recorded using Keithley 4200-SCS. Inset shows the equivalent circuit mimicking the galvanostatic characterization (Reon electronic resistance, Rion ionic resistance, Cδ chemical capacitance)