Table 1.
Data collection and analysis
| Data | Instrument/parameters | Specification/measurements |
| Data collection | Accelerating voltage, kV | 200 |
| Electron source | Field emission gun | |
| Wavelength, Å | 0.0251 | |
| Total electron dose per crystal, e−/Å2 | 25 | |
| No. of diffraction patterns per crystal | 134 | |
| No. of crystals | 1 | |
| Total reflections to 1.9 Å | 8,463 | |
| Data analysis | Space group | P43212 |
| Unit cell dimensions, Å | ||
| a = b | 79.90 | |
| c | 38.67 | |
| α = β = γ | 90° | |
| Resolution, Å (highest resolution bin) | 10–1.9 (2.14–1.90) | |
| Total unique reflections | 3,510 | |
| Reflections in working set | 3,337 (307) | |
| Reflections in free set | 173 (10) | |
| Multiplicity | 0.82 | |
| Completeness | 38.7 (10.5) | |
| RSplit, % | 27.9 (93.2) | |
| Rwork/Rfree, % | 29.1/28.3 (53.2/72.9) | |
| Overall correlation coefficient, % | 81.3 (29.2) | |
| Ramachandran % for outliers, favored | 0, 98.4 |
The highest resolution shell statistics are shown in parentheses.