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. 2018 Aug 3;8(3):56. doi: 10.3390/membranes8030056
A atoms
AA-APP aerosol-assisted atmospheric plasma polymerization
AAc acrylic acid
AC alternating current
AlCeO3 aluminum–cerium oxide
APP atmospheric plasma polymerization
AP-PECVD atmospheric-pressure plasma enhanced chemical vapor deposition
Ar argon
BSA bovine serum albumin
C=O carbonyl group
C6F14 perfluorohexane
C7F16 heptane
CF4 tetrafluoromethane
CFx fluorocarbon
CO2 carbon dioxide
–COO–/–COOH carboxylic group
CW continuous wave
DBD dielectric barrier discharge
DI deionized
DSSC dye-sensitized solar cells
e electrons
FTIR-ATR Fourier transform infrared spectroscopy-Attenuated total reflectance
H2O water
He helium
HMDSO hexamethyldisiloxane
IEP isoelectric point
LIB lithium-ion battery
M monomers
MA maleic anhydride
MF microfiltration
MTMOS methyltrimethoxysilane
N2 nitrogen
NC nanocomposite
NF nanofiltration
NH3 ammonia
NP nanoparticles
NR not report
O2 oxygen
OES optical emission spectroscopy
-OH hydroxyl group
PA poly(amide)
PC poly(carbonate)
PECVD plasma enhanced chemical vapor deposition
PEG poly(ethylene glycol)
PEO poly(ethylene oxide)
PES poly(ethersulfone)
PET poly(ethylene terephthalate)
PET-TM poly(ethylene terephthalate) track-etched membranes
PFSA perfluorosulfonic acid
PP poly(propylene)
PSf poly(sulfone)
PTFE poly(tetrafluoroethylene)
PVDF poly(vinylidene fluoride)
PVDF-HFP poly(vinylidene fluoride-co-hexafluoropropylene)
RF radio frequency
RMS roughness
RO reverse osmosis
sccm standard cubic centimeter per minute
SEM scanning electron microscope
SiO2 silica
SiO2–ZrO2 silicon dioxide–zirconium dioxide
SiOx silicon oxide
slm standard liters per minute
TFC thin film composite
TMMOS trimethylmethoxysilane
TSEM transmission scanning electron microscopy
UF ultrafiltration
VIM 1-vinylimidazole
WCA water contact angle
XPS X-ray photoelectron spectroscopy
ZnO zinc oxide