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. 2018 Aug 23;18(9):2780. doi: 10.3390/s18092780
Con Convergence
CRIM Complex Refractive Index Model
DUT Device Under Test
EM Electromagnetic
FD Frequency Domain
GPR Ground Penetrating Radar
GR Gelman–Rubin criterion
HF High Frequency
MCMC Monte Carlo Markov Chain
PTFE Polytetrafluorethylene
SCE Shuffled Complex Evolution
SOLT Short, Open, Load, Thru
TD Time Domain
TDR Time Domain Reflectometry
TEM Transverse Electromagnetic
TRL Thru, Reflect, Line
Uncert Uncertainty Range
VNA Vector Network Analyzer