Table 2.
Sample | dXRD a, nm | dTEM b, nm | Ssurf c, m2/g | SPh
e in Pure Air (λ = 470 nm) |
|
---|---|---|---|---|---|
SnO2 | 4 ± 1 | 4 ± 1 | 110 ± 5 | - | 1.00 |
SnO2 Ru-TT | 1.4 ± 0.1 | 2.72 | |||
In2O3 | 7 ± 1 | 7 ± 2 | 60 ± 5 | - | 1.30 |
In2O3 Ru-TT | 2.1 ± 0.2 | 3.15 |
a MOx crystallite size, estimated from XRD data; b MOx particle size (TEM); c MOx specific surface area; d obtained by EDX on thick films: M = Sn for the SnO2 Ru-TT sample; M = In for the In2O3 Ru-TT sample; e Effective photoresponse.