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. 2018 Aug 29;8(9):671. doi: 10.3390/nano8090671

Table 2.

Microstructure characteristics, composition and photoresponse of investigated samples.

Sample dXRD a, nm dTEM b, nm Ssurf c, m2/g [Ru][Ru]+[M] d, at.% SPh e in Pure Air
(λ = 470 nm)
SnO2 4 ± 1 4 ± 1 110 ± 5 - 1.00
SnO2 Ru-TT 1.4 ± 0.1 2.72
In2O3 7 ± 1 7 ± 2 60 ± 5 - 1.30
In2O3 Ru-TT 2.1 ± 0.2 3.15

a MOx crystallite size, estimated from XRD data; b MOx particle size (TEM); c MOx specific surface area; d obtained by EDX on thick films: M = Sn for the SnO2 Ru-TT sample; M = In for the In2O3 Ru-TT sample; e Effective photoresponse.