Fig. 5. Current densities at 0.1 V [A nm^–2] as a function of junction width [Å] (the shaded areas provide visual guides only). Extrapolated data points corresponding to MtrF and STC are indicated by arrows. Where applicable, the data are corrected for the current attenuation by 1 nm Si oxide and 0.7 nm saturated organic linker (as described in text). Adapted with permission from ref. 13, Amdursky et al., John Wiley and Sons.