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. 2018 Sep 17;9(9):473. doi: 10.3390/mi9090473
RTD Resistance Temperature Detector
e-beam Electron-Beam
EIS Electrochemical Impedance Spectroscopy
UV Ultraviolet
DI Deionized
TCR Temperature Coefficient of Resistance
CMOS Complementary Metal-Oxide-Semiconductor
RF Radio-Frequency
DC Direct Current
AC Alternating Current