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. 2018 Mar 20;9(3):138. doi: 10.3390/mi9030138

Table 1.

Fused silica etch rate and selectivity.

Mask Material Etch time (min) Etched SiOx Depth (μm) Etched Mask Depth (μm) Etch Rate (μm/min) Selectivity
KMPR 1035 110 57 43 0.52 1.33
a-Silicon 2.5 1 0.27 0.4 3.7
Chromium 45 22 1 0.49 22