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. 2018 Aug 17;9(8):407. doi: 10.3390/mi9080407

Figure 3.

Figure 3

(a) Dielectric constant of the TiO2−x NPs embedded PDMS layers according to the frequency with different TiO2−x NPs weight ratios; (b) De-convoluted X-ray photoelectron spectroscopy (XPS) spectra of oxygen (O) 1s states of pristine PDMS layer and TiO2−x NPs 5% embedded PDMS layer; (c) Schematic of the electron attraction mechanism according to oxygen vacancies of the PDMS surface, and (d) COMSOL simulation results of the pristine TENG and TiO2−x NPs 5% embedded TENG.