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. 2018 Aug 17;9(8):407. doi: 10.3390/mi9080407

Figure 4.

Figure 4

(a) O-K edge X-ray absorption spectroscopy (XAS) spectra and (b) Kelvin probe force microscopy (KPFM) images of PDMS layers as a function of the TiO2−x NPs embedded weight ratios; (c) Schematic of the electron leakage mechanism according to electron path formation.