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. 2017 Dec 1;8(12):354. doi: 10.3390/mi8120354

Figure 3.

Figure 3

Scanning electron microscope (SEM) micrographs of the third design: (a) latch and latch lock, (b) whole device illustrating the curved back facet, (c) gap-closing structure where the yellow-dashed arrows show springs displacements, and the green-dashed arrow shows the gap closer resulting displacement, and (d) spring.