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. 2018 Feb 6;10(2):36. doi: 10.1007/s40820-017-0186-9

Fig. 1.

Fig. 1

Identification and detection of the nanopillars of the black silicon surfaces. a Training set based on the SEM images of bSi-1 (×10,000 magnification) used to distinguish pillar tips and free regions between the pillars. P: pillar tip; E: empty space between pillars. b Detected pillar tips (red squares) on each type of bSi surface. Scale bars correspond to 500 nm. (Color figure online)