Fig. 1. (a) SEM image of Ge1–xSnx NWs and corresponding XRD pattern (inset) after Sn seed removal, showing the shifted signal when compared to the Ge reference. (b) The composition of the Ge1–xSnx NW can be also determined by EDX point measurements while the specific locations along the NW are illustrated in the STEM-EDX image. The EDX map also shows the Sn growth seed used to form these nanostructures.
