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. 2018 Sep 22;11(10):1801. doi: 10.3390/ma11101801
ANOVA One-way analysis of variance
BSE Backscattered electrons
CAD-CAM Computer-aided design and computer-aided manufacturing
Co-Cr Cobalt-chromium
CTE Coefficient of thermal expansion
EDX Energy dispersive X-Ray spectroscopy
PFM Porcelain-fused-to-metal
Ra Arithmetic average of the roughness profile
Rm Ultimate tensile strength
Rp0.2 0.2 % yield strength
SEM Scanning electron microscopy
SLM Selective laser melting