Figure 2.

Characterization of silicon ‘dummy’ microelectrode with thiol-ene polymer. Dip coating of 25 µm thick microelectrodes with a uniform layer of shape memory polymer (SMP) to generate approximately 30 µm thick coated devices; (A) the polymer detached before surface modification of silicon probes, (B) nicely coated the silicon shanks after surface modification. (C) In some cases, the coating would form ‘beads’ due to slow removal. Checkmarks and crosses indicate whether probes were used for in vivo studies or not. (D) Optical and scanning electron microscope (SEM) images in the side view to assess the thickness of the coating, and (E) schematic drawing of coating thickness with respect to the shank geometry.