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. 2018 Nov 6;8:16407. doi: 10.1038/s41598-018-34717-9

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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The image of 1500 lpi mesh obtained on LiF for the evaluation of an instrumental spatial resolution: Panel (a) contains a large field of view photoluminescent image, observed with a 4X microscope objective. Panel (b) shows part of the full image with different elements of target, observed with objective 40X, while panel (c) shows an enlarged crop of this image, in which the diffraction pattern in open areas of the mesh is clearly seen. Panel (d) contains an intensity profile taken from the cropped image.