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. 2018 Oct 18;122(44):25498–25505. doi: 10.1021/acs.jpcc.8b08713

Figure 5.

Figure 5

(a) Three-dimensional (3D) image of HfSe2 surface after air exposure for 2 days. The blue dashed line profiles the flake height, It = 0.6 nA, Vs = −2.5 V; (b) dI/dV spectra of the oxidized surface (black curve) and pristine HfSe2 (red dashed curve) measured with the same STM tip, It = 0.4 nA, Vs = −1.5 V.