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. 2018 Nov 13;8:16763. doi: 10.1038/s41598-018-35195-9

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Characterization of PDMS stamp and patterned surface by μCP-DFGP. (a) Schematic representation of the sequential μCP-DFGP procedure. (b) Scanning electron micrograph of a fabricated PDMS stamp. (c) Optical image for a PDMS stamp containing a circular dot array (left) and fluorescent image of patterned FITC-BSA and surrounding PEG-silane (right). (d) Line profile showing a clearly defined bi-composite fluorescent pattern. Inset image indicates the lateral speading of patterned 1^st ink. (e) Optical image for PDMS stamp containing line pattens (left) and fluorescent image for FITC-BSA/PEG-silane line patterns (right). (f) Parallel line profile showing a clearly defined bi-composite fluorescent pattern. The lines had a width of 50 μm and a spacing of 30 μm. The scale bars represent 100 μm.