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. 2018 Sep 24;18(11):7171–7175. doi: 10.1021/acs.nanolett.8b03240

Table 1.

  a [nm] r [nm] Rm at 1550 nm
Low R 1240 475 33%
Mid R 1310 500 56%
High R 1372 525 99.8%
a

Lattice constant a and hole radius r of the PhC patterns used in this work as well as their measured reflectivity Rm at our operating wavelength of 1550 nm.