BOX 2.

A collection of sectioning strategies for vEM. vEM using non-block face imaging (TEM and SEM) requires collecting large unbroken series of serial sections. There are multiple ways of making the process less error-prone, each with its own merit. One simply has to choose which process works best for them, or devise their own strategy. ¹Gay and Anderson (1954);²Westfall and Healy (1962); ³Fahrenbach Wolf (1984);⁴Galey and Nilsson (1966); ⁵Mironov et al. (2008);⁶Anderson and Brenner (1971);⁷Rowley and Moran (1975); ⁸Abad (1988); ⁹Wells (1974); ¹⁰Mironov et al. (2008); ¹¹Stevens et al. (1980); ¹²Hall (1995); ¹³Schalek et al. (2012);¹⁴Micheva and Smith (2007); ¹⁵Burel et al. (2018); ¹⁶Leica Microsystems, Germany.