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. 2018 Nov 29;9:5070. doi: 10.1038/s41467-018-07396-3

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© The Author(s) 2018

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Fig. 3 — The extent of silicon contamination on the surface of typical solvent-exfoliated graphene derived from low-purity graphite (98% purity). a HAADF image of a typical graphene sheet. b Detail of HAADF image of the boxed region in a. c EDS spectrum of the boxed region in a. The strong Si peak at 1.739 keV confirms the presence of significant contamination. d, e A comparison of the EDS spectra of the contaminated area (d) and non-contaminated and monolayer area (e), which are marked as red and green boxes in b, respectively