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. 2018 Oct 23;11(11):2068. doi: 10.3390/ma11112068

Figure 2.

Figure 2

Atomic force microscopy (AFM) micrographs (5 × 5 µm) of thin films of 1:1 TQ1:PC70BM (ac) and 1:3 TQ1:PC70BM (df) spin-coated from chloroform (CF) (a,d), chlorobenzene (CB) (b,e), and ortho-dichlorobenzene (oDCB) (c,f). Scale bar indicates 1 µm. Surface roughness (RMS), as well as the corresponding height scale, is added to each image.