Oxford Diffraction Xcalibur single crystal X-ray diffractometer with Sapphire CCD detector	2178 reflections with I > 2σ(I)
Radiation source: Enhance (Mo) X-ray Source	Rint = 0.021
Rotation method data acquisition using ω scans.	θmax = 25.4°, θmin = 3.2°
Absorption correction: multi-scan (CrysAlis RED; Oxford Diffraction, 2009)	h = −19→27
Tmin = 0.911, Tmax = 0.963	k = −6→6
9384 measured reflections	l = −14→15
2870 independent reflections