Fig. 3. Light-emitting performance of the self-healed EL device after cutting–healing process.

a Demonstration of cutting–healing process of the healable EL device. a-i–a-iii exhibit the initial working state, cut state, and revived working state, respectively, after healing. a-iv shows the bend working state of the healed EL device. b Luminance–voltage characteristics of the EL device for the initial and healed states. c Distribution of the electrical field across the phosphor layer, where the color bar represents the intensity of the electrical field. d Magnified image of a marked region in c, where the lengths and directions of the arrows represent the values and directions, respectively, of the electrical field adjacent to the healing region. e The value variation of the electrical fields as a function of the distance to the healing point, where ΙEΙ represents the values of the redistributed electrical fields and ΙE₀Ι represents the original value of the distributed electrical fields before the cutting–healing process