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. 2018 Dec 5;7:102. doi: 10.1038/s41377-018-0096-8

Fig. 4. Self-healable EL device subjected to different cutting modes.

Fig. 4

a, c demonstrate photographs of the EL device subjected to multiple cutting–healing times in FCM. b, d exhibit the relationships between luminance–voltage-healing times of the self-healable EL device throughout FCM and UFCM at 2 V/µm and 500 Hz, respectively