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. Author manuscript; available in PMC: 2019 Jul 1.
Published in final edited form as: IEEE J Solid-State Circuits. 2018 Apr 27;53(7):2054–2064. doi: 10.1109/JSSC.2018.2820705

Fig. 9.

Fig. 9

(a) Test pixel schematics. (b) Average leakage measurement results from the test structures with 0.5 V applied across each (left) and the average leakage of all the test structures at different sensor voltages (n = 3).