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. 2018 Dec 7;9:2999–3012. doi: 10.3762/bjnano.9.279

Figure 10.

Figure 10

Approach 3 - Step C (PS + 50 nm SiO2 + 50 nm Al2O3 and PS + 100 nm Al2O3 samples). a) Average topography profiles, b) average EFM signal profiles (lower panel) and the corresponding EFM images (upper panels).