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. 2018 Dec 7;9:2999–3012. doi: 10.3762/bjnano.9.279

Figure 2.

Figure 2

Approach 1 (PS + 100 nm Al2O3 and PS + 100 nm Al2O3 + PVAc samples): (a) average topography profiles, (b) average EFM signal profiles, and the corresponding AFM and EFM images (upper panels); tip–sample distance z ≈ 21 nm; reproduced with permission from [39], copyright 2018 IEEE.