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. 2018 Dec 7;9:2999–3012. doi: 10.3762/bjnano.9.279

Figure 4.

Figure 4

Approach 2: EFM images of PS + 50nmSiO2 (upper) and PS + 100 nm Al2O3 + 50 nm SiO2 (middle panel) samples, and their corresponding EFM signal distribution histogram (bottom); z = 21 nm.