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. 2018 Dec 7;9:2999–3012. doi: 10.3762/bjnano.9.279

Figure 8.

Figure 8

Approach 3 (step A) PS + 100 nm Al2O3 and PS + 100 nm SiO2 samples: (a) Average topography profiles, (b) average EFM signal profiles, and their corresponding EFM images (upper panels).