Fig. 4.

Schematics of the general fabrication process and experimental setup. (A) Schematics of the fabrication process of each Miura-FSS layer, which consists of the perforation of the modified Miura-Ori pattern, inkjet printing of the dipole elements, and manual folding of the pattern. (B) Schematics of the experimental characterization setup. Top box shows a side (“plane of incidence”) view of the setup, where angle of incidence (AoI) represents how much we tilted the support table, reflecting the relative angle between the incident waves and the normal to the FSS structure plane.